default search action

combined dblp search
author search
venue search
publication search

ask others

"A roughness Measurement Method Based on Genetic Algorithm and Neural ..."

Wei Liu et al. (2012)

> Home

Details and statistics

DOI: 10.1142/S0218126612500053

access: closed

type: Journal Article

metadata version: 2023-03-21

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/jcsc/LiuZLJ12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jcsc/LiuZLJ12
Wei Liu, Xiuyan Zheng, Shuangjun Liu, Zhenyuan Jia:
A roughness Measurement Method Based on Genetic Algorithm and Neural Network for Microheterogeneous Surface in Deep-Hole Parts. J. Circuits Syst. Comput. 21(1) (2012)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.