default search action

combined dblp search
author search
venue search
publication search

ask others

"A Deep Neural Network-Based Intelligent Detection Model for Manufacturing ..."

Wenbo Xu, Gang Liu, Mengmeng Wang (2023)

> Home

Details and statistics

DOI: 10.1142/S0218126623502365

access: closed

type: Journal Article

metadata version: 2024-04-01

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/jcsc/XuLW23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jcsc/XuLW23
Wenbo Xu, Gang Liu, Mengmeng Wang:
A Deep Neural Network-Based Intelligent Detection Model for Manufacturing Defects of Automobile Parts. J. Circuits Syst. Comput. 32(14): 2350236:1-2350236:17 (2023)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.