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"Test generation for data-path logic: the F-path method."

Smith Freeman (1988)

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DOI: 10.1109/4.1002

access: closed

type: Journal Article

metadata version: 2024-11-05

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Smith Freeman:
Test generation for data-path logic: the F-path method. IEEE J. Solid State Circuits 23(2): 421-427 (1988)

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