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"Impact of temperature variation on noise parameters and HCI degradation of ..."

Alok Kumar et al. (2023)

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DOI: 10.1016/J.MEJO.2023.105720

access: closed

type: Journal Article

metadata version: 2023-03-28

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Alok Kumar, Tarun Kumar Gupta, Bhavana P. Shrivastava, Abhinav Gupta:
Impact of temperature variation on noise parameters and HCI degradation of Recessed Source/Drain Junctionless Gate All Around MOSFETs. Microelectron. J. 134: 105720 (2023)

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