SOA expansion and reliability enhancement of 700V LDMOS: Experimental characterization and mechanism validation.

Yongshun Li Teng Liu Zhenyan Liu Nailong He Hao Wang Ting Wang Ziao Zhang Liang Song Xinxin Liu Dejin Wang Sen Zhang SOA expansion and reliability enhancement of 700V LDMOS: Experimental characterization and mechanism validation. 2026 107184 173 Microelectron. J. https://doi.org/10.1016/j.mejo.2026.107184 db/journals/mj/mj173.html#LiLLHWWZSLWZ26 streams/journals/mj