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"Defects in Microelectronic Materials and Devices, Daniel M. Fleetwood, ..."

Ahmed Amin (2009)

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DOI: 10.1016/J.MICROREL.2009.03.017

access: closed

type: Journal Article

metadata version: 2020-02-22

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Ahmed Amin:
Defects in Microelectronic Materials and Devices, Daniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. Schrimpf (Eds.). Taylor and Francis Group LLC, Boca Raton, FL, USA. Microelectron. Reliab. 49(7): 821-822 (2009)

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