AlGaN/GaN High Electron Mobility Transistor degradation under on- and off-state stress.

E. A. Douglas C. Y. Chang David J. Cheney B. P. Gila Chi-Fai Lo Liu Lu M. R. Holzworth Patrick G. Whiting Kevin S. Jones Glen David Via Jinhyung Kim Soohwan Jang Fan Ren Stephen J. Pearton AlGaN/GaN High Electron Mobility Transistor degradation under on- and off-state stress. 207-211 2011 51 Microelectron. Reliab. 2 https://doi.org/10.1016/j.microrel.2010.09.024 db/journals/mr/mr51.html#DouglasCCGLLHWJVKJRP11