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"Reliability of submicron InGaAs/InP DHBT under thermal and electrical ..."

G. A. Koné et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.07.073

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/KoneGHMMLZNRG11
G. A. Koné, Brice Grandchamp, C. Hainaut, François Marc, Cristell Maneux, Nathalie Labat, Thomas Zimmer, Virginie Nodjiadjim, Muriel Riet, Jean Godin:
Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses. Microelectron. Reliab. 51(9-11): 1730-1735 (2011)

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