Accelerated assessment of fine-grain AVF in NoC using a Multi-Cell Upsets considered fault injection.

Jiajia Jiao Yuzhuo Fu Shi-Jie Wen Accelerated assessment of fine-grain AVF in NoC using a Multi-Cell Upsets considered fault injection. 2629-2640 2014 54 Microelectron. Reliab. 11 https://doi.org/10.1016/j.microrel.2014.06.008 db/journals/mr/mr54.html#JiaoFW14