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"Characterization of Low Drop-Out during ageing and design for yield."

R. Lajmi et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.07.047

access: closed

type: Journal Article

metadata version: 2020-02-22

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  dblp key:
  - journals/mr/LajmiCLBBHF17
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  - https://dblp.org/rec/journals/mr/LajmiCLBBHF17
R. Lajmi, Florian Cacho, Estelle Lauga-Larroze, Sylvain Bourdel, Ph. Benech, Vincent Huard, X. Federspiel:
Characterization of Low Drop-Out during ageing and design for yield. Microelectron. Reliab. 76-77: 92-96 (2017)

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