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"Reliability assessment on new reprogrammable non-volatile memory devices ..."

Yuan Li et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.07.054

access: closed

type: Journal Article

metadata version: 2020-02-22

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Yuan Li, Romain Delangle, Xiao-mei Zhang, Bart Hovens:
Reliability assessment on new reprogrammable non-volatile memory devices based on SiCr-O. Microelectron. Reliab. 51(9-11): 1474-1478 (2011)

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