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"Parametric defect localization on integrated circuits - From static laser ..."

Luc Saury (2014)

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DOI: 10.1016/J.MICROREL.2013.11.007

access: closed

type: Journal Article

metadata version: 2020-02-22

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Luc Saury:
Parametric defect localization on integrated circuits - From static laser stimulation to real-time variation mapping (RTVM). Microelectron. Reliab. 54(2): 366-373 (2014)

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