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"The ROCS Workshop and 25 years of compound semiconductor reliability."

William J. Roesch (2011)

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DOI: 10.1016/J.MICROREL.2010.09.005

access: closed

type: Journal Article

metadata version: 2020-02-22

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William J. Roesch:
The ROCS Workshop and 25 years of compound semiconductor reliability. Microelectron. Reliab. 51(2): 188-194 (2011)

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