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"Reliable ultra-low-voltage low-power probabilistic-based noise-tolerant ..."

I-Chyn Wey, Yi-Jung Lan, Chien-Chang Peng (2013)

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DOI: 10.1016/J.MICROREL.2013.06.002

access: closed

type: Journal Article

metadata version: 2020-02-22

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I-Chyn Wey, Yi-Jung Lan, Chien-Chang Peng:
Reliable ultra-low-voltage low-power probabilistic-based noise-tolerant latch design. Microelectron. Reliab. 53(12): 2057-2069 (2013)

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