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"The influence of ferroelectric-electrode interface layer on the electrical ..."
Yongguang Xiao et al. (2012)
- Yongguang Xiao, Minghua Tang, Jiancheng Li, Bo Jiang, John He:
The influence of ferroelectric-electrode interface layer on the electrical characteristics of negative-capacitance ferroelectric double-gate field-effect transistors. Microelectron. Reliab. 52(4): 757-760 (2012)
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