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"High temperature gate-bias and reverse-bias tests on SiC MOSFETs."

Li Yang, Alberto Castellazzi (2013)

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DOI: 10.1016/J.MICROREL.2013.07.065

access: closed

type: Journal Article

metadata version: 2020-02-22

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Li Yang, Alberto Castellazzi:
High temperature gate-bias and reverse-bias tests on SiC MOSFETs. Microelectron. Reliab. 53(9-11): 1771-1773 (2013)

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