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"Designs of Two Quadruple-Node-Upset Self-Recoverable Latches for Highly ..."

Aibin Yan et al. (2023)

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DOI: 10.1109/TAES.2022.3219372

access: closed

type: Journal Article

metadata version: 2023-07-07

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  - journals/taes/YanLCHNGW23
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  - https://dblp.org/rec/journals/taes/YanLCHNGW23
Aibin Yan, Zhixing Li, Jie Cui, Zhengfeng Huang, Tianming Ni, Patrick Girard, Xiaoqing Wen:
Designs of Two Quadruple-Node-Upset Self-Recoverable Latches for Highly Robust Computing in Harsh Radiation Environments. IEEE Trans. Aerosp. Electron. Syst. 59(3): 2885-2897 (2023)

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