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"Generation of Two-Cycle Tests for Structurally Similar Circuits."

Jerin Joe et al. (2024)

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DOI: 10.1109/TCAD.2023.3321973

access: closed

type: Journal Article

metadata version: 2024-02-29

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  - https://dblp.org/rec/journals/tcad/JoeMPR24
Jerin Joe, Nilanjan Mukherjee, Irith Pomeranz, Janusz Rajski:
Generation of Two-Cycle Tests for Structurally Similar Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43(2): 694-703 (2024)

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