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"Functional Design-for-Testability for Functional Test Sequences."

Irith Pomeranz (2024)

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DOI: 10.1109/TCAD.2024.3396654

access: closed

type: Journal Article

metadata version: 2024-12-22

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Irith Pomeranz:
Functional Design-for-Testability for Functional Test Sequences. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43(12): 4852-4859 (2024)

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