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"Scan-Based Delay Test Types and Their Effect on Power Dissipation During Test."

Irith Pomeranz, Sudhakar M. Reddy (2008)

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DOI: 10.1109/TCAD.2007.907231

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/PomeranzR08b
Irith Pomeranz, Sudhakar M. Reddy:
Scan-Based Delay Test Types and Their Effect on Power Dissipation During Test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(2): 398-403 (2008)

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