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"Techniques and algorithms for fault grading of FPGA interconnect test ..."

Mehdi Baradaran Tahoori, Subhasish Mitra (2004)

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DOI: 10.1109/TCAD.2003.822112

access: closed

type: Journal Article

metadata version: 2021-07-25

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Mehdi Baradaran Tahoori, Subhasish Mitra:
Techniques and algorithms for fault grading of FPGA interconnect test configurations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23(2): 261-272 (2004)

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