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"Critical path selection for delay fault testing based upon a statistical ..."

Li-C. Wang, Jing-Jia Liou, Kwang-Ting Cheng (2004)

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DOI: 10.1109/TCAD.2004.835137

access: closed

type: Journal Article

metadata version: 2022-12-07

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Li-C. Wang, Jing-Jia Liou, Kwang-Ting Cheng:
Critical path selection for delay fault testing based upon a statistical timing model. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23(11): 1550-1565 (2004)

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