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"Diagnosis of Integrated Circuits With Multiple Defects of Arbitrary ..."

Xiaochun Yu, Ronald D. Blanton (2010)

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DOI: 10.1109/TCAD.2010.2048352

access: closed

type: Journal Article

metadata version: 2020-09-24

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Xiaochun Yu, Ronald D. Blanton:
Diagnosis of Integrated Circuits With Multiple Defects of Arbitrary Characteristics. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(6): 977-987 (2010)

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