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"A Statistical Framework for Post-Fabrication Oxide Breakdown Reliability ..."

Cheng Zhuo, Dennis Sylvester, David T. Blaauw (2013)

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DOI: 10.1109/TCAD.2012.2228303

access: closed

type: Journal Article

metadata version: 2020-09-24

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Cheng Zhuo, Dennis Sylvester, David T. Blaauw:
A Statistical Framework for Post-Fabrication Oxide Breakdown Reliability Prediction and Management. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(4): 630-643 (2013)

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