<?xml version="1.0" encoding="US-ASCII"?>
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<article key="journals/tcasII/WeiCZ24" mdate="2024-08-22">
<author orcid="0000-0002-7676-7596">Feng Wei</author>
<author orcid="0000-0002-3382-3703">Xiaole Cui</author>
<author orcid="0009-0000-9539-1427">Sunrui Zhang</author>
<title>An in-Array Build-In Self-Test Scheme for Embedded SRAM Array.</title>
<pages>3935-3939</pages>
<year>2024</year>
<month>August</month>
<volume>71</volume>
<journal>IEEE Trans. Circuits Syst. II Express Briefs</journal>
<number>8</number>
<ee>https://doi.org/10.1109/TCSII.2024.3375637</ee>
<url>db/journals/tcasII/tcasII71.html#WeiCZ24</url>
<stream>streams/journals/tcasII</stream>
</article>
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