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"A Statistical Framework for Improved Automatic Flaw Detection in ..."

Ye Tian et al. (2017)

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DOI: 10.1080/00401706.2016.1153000

access: closed

type: Journal Article

metadata version: 2018-11-14

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  - journals/technometrics/TianMMH17
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Ye Tian, Ranjan Maitra, William Q. Meeker, Stephen D. Holland:
A Statistical Framework for Improved Automatic Flaw Detection in Nondestructive Evaluation Images. Technometrics 59(2): 247-261 (2017)

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