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"The Sender-Excited Secret Key Agreement Model: Capacity, Reliability, and ..."

Tzu-Han Chou, Vincent Y. F. Tan, Stark C. Draper (2015)

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DOI: 10.1109/TIT.2014.2369496

access: closed

type: Journal Article

metadata version: 2021-04-09

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Tzu-Han Chou, Vincent Y. F. Tan, Stark C. Draper:
The Sender-Excited Secret Key Agreement Model: Capacity, Reliability, and Secrecy Exponents. IEEE Trans. Inf. Theory 61(1): 609-627 (2015)

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