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"Robustness and Balancing of Parallel-Connected Power Devices: SiC Versus ..."

Ji Hu et al. (2016)

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DOI: 10.1109/TIE.2015.2500187

access: closed

type: Journal Article

metadata version: 2021-10-14

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  - https://dblp.org/rec/journals/tie/HuAGBARM16
Ji Hu, Olayiwola Alatise, Jose Angel Ortiz Gonzalez, Roozbeh Bonyadi, Petros Alexakis, Li Ran, Philip Mawby:
Robustness and Balancing of Parallel-Connected Power Devices: SiC Versus CoolMOS. IEEE Trans. Ind. Electron. 63(4): 2092-2102 (2016)

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