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"New Short-Long-Term Degradation Model for Precise Battery Health Prognostics."

Jin-Zhen Kong et al. (2023)

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DOI: 10.1109/TIE.2022.3212365

access: closed

type: Journal Article

metadata version: 2023-04-29

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  - journals/tie/KongCHLW23
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  - https://dblp.org/rec/journals/tie/KongCHLW23
Jin-Zhen Kong, Di Cui, Bingchang Hou, Xingchen Liu, Dong Wang:
New Short-Long-Term Degradation Model for Precise Battery Health Prognostics. IEEE Trans. Ind. Electron. 70(9): 9527-9537 (2023)

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