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"Prognostication of Residual Life and Latent Damage Assessment in Lead-Free ..."

Pradeep Lall et al. (2011)

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DOI: 10.1109/TIE.2010.2089936

access: closed

type: Journal Article

metadata version: 2023-09-30

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  - https://dblp.org/rec/journals/tie/LallBHMVG11
Pradeep Lall, Chandan Bhat, Madhura Hande, Vikrant More, Rahul Vaidya, Kai Goebel:
Prognostication of Residual Life and Latent Damage Assessment in Lead-Free Electronics Under Thermomechanical Loads. IEEE Trans. Ind. Electron. 58(7): 2605-2616 (2011)

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