Chengmin Li Jing Sheng Drazen Dujic Reliable Gate Driving of SiC MOSFETs With Crosstalk Voltage Elimination and Two-Step Short-Circuit Protection. 10066-10075 2023 October 70 IEEE Trans. Ind. Electron. 10 https://doi.org/10.1109/TIE.2022.3224124 db/journals/tie/tie70.html#LiSD23