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"Short-Circuit Failure Mechanisms of 650-V GaN/SiC Cascode Devices in ..."

Jiahui Sun et al. (2022)

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DOI: 10.1109/TIE.2021.3099247

access: closed

type: Journal Article

metadata version: 2022-03-15

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  - https://dblp.org/rec/journals/tie/SunZZLC22
Jiahui Sun, Kailun Zhong, Zheyang Zheng, Gang Lyu, Kevin J. Chen:
Short-Circuit Failure Mechanisms of 650-V GaN/SiC Cascode Devices in Comparison With SiC MOSFETs. IEEE Trans. Ind. Electron. 69(7): 7340-7348 (2022)

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