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"Monitoring Chip Branch Failure in Multichip IGBT Modules Based on Gate Charge."
Kaihong Wang et al. (2023)
- Kaihong Wang
, Pengju Sun
, Binxin Zhu
, Quanming Luo
, Xiong Du
:
Monitoring Chip Branch Failure in Multichip IGBT Modules Based on Gate Charge. IEEE Trans. Ind. Electron. 70(5): 5214-5223 (2023)
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