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"Long-Tailed Defects Classification Based on Probabilistic Aggregation ..."

Jiajun Chen et al. (2024)

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DOI: 10.1109/TII.2024.3413982

access: closed

type: Journal Article

metadata version: 2024-11-06

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  - https://dblp.org/rec/journals/tii/ChenYQJ24
Jiajun Chen, Hongpeng Yin, Yan Qin, Weijie Jiang:
Long-Tailed Defects Classification Based on Probabilistic Aggregation Network for Light-Emitting Diode Packaging Process. IEEE Trans. Ind. Informatics 20(10): 12136-12146 (2024)

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