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"A High-Efficient Measurement System With Optimization Feature for ..."

Miron Klosowski et al. (2018)

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DOI: 10.1109/TIM.2018.2814118

access: closed

type: Journal Article

metadata version: 2020-09-05

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  - journals/tim/KlosowskiJJBSK18
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  - https://dblp.org/rec/journals/tim/KlosowskiJJBSK18
Miron Klosowski, Jacek Jakusz, Waldemar Jendernalik, Grzegorz Blakiewicz, Stanislaw Szczepanski, Slawomir Koziel:
A High-Efficient Measurement System With Optimization Feature for Prototype CMOS Image Sensors. IEEE Trans. Instrum. Meas. 67(10): 2363-2372 (2018)

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