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"Multiscale Convolution-Based Probabilistic Classification for Detecting ..."

Lei Lei, Han-Xiong Li, Hai-Dong Yang (2023)

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DOI: 10.1109/TIM.2022.3229708

access: closed

type: Journal Article

metadata version: 2023-01-31

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Lei Lei, Han-Xiong Li, Hai-Dong Yang:
Multiscale Convolution-Based Probabilistic Classification for Detecting Bare PCB Defects. IEEE Trans. Instrum. Meas. 72: 1-8 (2023)

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