default search action

combined dblp search
author search
venue search
publication search

ask others

"A General Method to Accurately Measure the Thin-Film Sheet Resistance for ..."

Xingyi Wu et al. (2021)

> Home

Details and statistics

DOI: 10.1109/TIM.2021.3109390

access: closed

type: Journal Article

metadata version: 2021-09-20

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tim/WuDFZGSWHS21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tim/WuDFZGSWHS21
Xingyi Wu, Yijie Dai, Chen Fu, Xiaobo Zhu, Wenhua Gu, Daying Sun, Wen Wu, Xiaodong Huang, Zhongxiang Shen:
A General Method to Accurately Measure the Thin-Film Sheet Resistance for Sensors. IEEE Trans. Instrum. Meas. 70: 1-9 (2021)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.