<?xml version="1.0" encoding="US-ASCII"?>
<dblp>
<article key="journals/tim/ZhangPNWSW25" mdate="2025-07-06">
<author orcid="0000-0002-6245-0846">Yuan Zhang</author>
<author orcid="0000-0003-1825-0393">Chenghan Pu</author>
<author orcid="0009-0009-0242-7052">Muyuan Niu</author>
<author orcid="0000-0003-2337-0664">Qiaoyun Wu</author>
<author orcid="0000-0001-5266-1933">Wei Sun</author>
<author orcid="0000-0001-9223-2615">Jun Wang 0039</author>
<title>Gold Wire Bonding Quality Inspection of Integrated Circuit Based on Slenderness-Rotated Object Detection.</title>
<pages>1-16</pages>
<year>2025</year>
<volume>74</volume>
<journal>IEEE Trans. Instrum. Meas.</journal>
<ee>https://doi.org/10.1109/TIM.2025.3552386</ee>
<url>db/journals/tim/tim74.html#ZhangPNWSW25</url>
<stream>streams/journals/tim</stream>
</article>
</dblp>
