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"Edge Word-Line Reliability Problem in 3-D NAND Flash Memory: Observations, ..."

Debao Wei et al. (2023)

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DOI: 10.1109/TVLSI.2023.3249183

access: closed

type: Journal Article

metadata version: 2023-06-02

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Debao Wei, Hua Feng, Ming Liu, Yu Song, Zhelong Piao, Cong Hu, Liyan Qiao:
Edge Word-Line Reliability Problem in 3-D NAND Flash Memory: Observations, Analysis, and Solutions. IEEE Trans. Very Large Scale Integr. Syst. 31(6): 861-873 (2023)

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