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"Accumulator-based test generation for robust sequential fault testing in ..."

Ioannis Voyiatzis, Dimitris Gizopoulos, Antonis M. Paschalis (2005)

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DOI: 10.1109/TVLSI.2005.857159

access: closed

type: Journal Article

metadata version: 2020-10-26

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  - journals/tvlsi/VoyiatzisGP05
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  - https://dblp.org/rec/journals/tvlsi/VoyiatzisGP05
Ioannis Voyiatzis, Dimitris Gizopoulos, Antonis M. Paschalis:
Accumulator-based test generation for robust sequential fault testing in DSP cores in near-optimal time. IEEE Trans. Very Large Scale Integr. Syst. 13(9): 1079-1086 (2005)

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