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Mike Ricchetti
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2010 – 2019
- 2016
- [c9]Mike Ricchetti, Eric Rentschler, Amit Majumdar, Mike Lowe, Mark LaVine, Skip Lindsey, Sharad Kumar:
Special panel session IIB: "System validation and silicon debug - Is standardization possible?". VTS 2016: 1 - 2015
- [c8]Mike Ricchetti:
Innovative practices session 3C: Advances in silicon debug & diagnosis. VTS 2015: 1 - 2013
- [j3]Arie Margulis, David Akselrod, Eric Rentschler, Mike Ricchetti:
Evolution of Graphics Northbridge Test and Debug Architectures Across Four Generations of AMD ASICs. IEEE Des. Test 30(4): 16-25 (2013)
2000 – 2009
- 2006
- [c7]Ken Posse, Al Crouch, Jeff Rearick, Bill Eklow, Mike Laisne, Ben Bennetts, Jason Doege, Mike Ricchetti, Jean-Francois Cote:
IEEE P1687: Toward Standardized Access of Embedded Instrumentation. ITC 2006: 1-8 - 2004
- [c6]C. J. Clark, Mike Ricchetti:
A Code-less BIST Processor for Embedded Test and in-system configuration of Boards and Systems. ITC 2004: 857-866 - 2003
- [j2]C. J. Clark, Mike Ricchetti:
Infrastructure IP for Configuration and Test of Boards and Systems. IEEE Des. Test Comput. 20(3): 78-87 (2003) - [c5]Bill Eklow, Carl Barnhart, Mike Ricchetti, Terry Borroz:
IEEE 1149.6 - A Practical Perspective. ITC 2003: 494-502 - 2002
- [j1]Erik Jan Marinissen
, Rohit Kapur, Maurice Lousberg, Teresa L. McLaurin, Mike Ricchetti, Yervant Zorian:
On IEEE P1500's Standard for Embedded Core Test. J. Electron. Test. 18(4-5): 365-383 (2002) - [c4]Fidel Muradali, Mike Ricchetti, Bart Vermeulen, Bulent I. Dervisoglu, Bob Gottlieb, Bernd Koenemann, C. J. Clark:
Reducing Time to Volume and Time to Market: Is Silicon Debug and Diagnosis the Answer? VTS 2002: 445-446 - 2001
- [c3]Dwayne Burek, Garen Darbinyan, Rohit Kapur, Maurice Lousberg, Teresa L. McLaurin, Mike Ricchetti:
IP and Automation to Support IEEE P1500. VTS 2001: 411-412
1990 – 1999
- 1998
- [c2]Bulent I. Dervisoglu, Mike Ricchetti, William Eklow:
Shared I/O-cell structures: a framework for extending the IEEE 1149.1 boundary-scan standard. ITC 1998: 980-989
1980 – 1989
- 1988
- [c1]Mike Ricchetti, John Hoglund:
Scan Diagnostic Strategy for the Series 10000 Prism Workstation. ITC 1988: 987-992
Coauthor Index
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