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Colin M. Maunder
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- affiliation: British Telecom Laboratories
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1990 – 1999
- 1999
- [j9]Colin Maunder:
Test: shared problems and shared solutions. IEEE Commun. Mag. 37(6): 65-70 (1999) - 1998
- [j8]Colin M. Maunder:
The Future: Plug and Pray? IEEE Des. Test Comput. 15(2): 8-13 (1998) - 1997
- [c6]Colin M. Maunder:
Plug and Play or Plug and Pray: We Have a Right to Know It Will Work (Or Why It Won't). ITC 1997: 11 - 1994
- [c5]Alfred L. Crouch, Rick Ramus, Colin M. Maunder:
Low-Power Mode and IEEE 1149.1 Compliance - A Low-Power Solution. ITC 1994: 660-669 - 1993
- [j7]Colin Maunder:
Boundary-scan testing. Microprocess. Microsystems 17(5): 258 (1993) - [j6]Colin M. Maunder, Rodham E. Tulloss:
Testability on TAP. Microprocess. Microsystems 17(5): 259-265 (1993) - [c4]Colin M. Maunder:
A Universal Framework for Managed Built-in Test. ITC 1993: 21-29 - [c3]Colin M. Maunder:
Position Statement: ITC93 Boundary-Scan Panel. ITC 1993: 262 - 1992
- [j5]Colin M. Maunder:
A D&T Special Report-Boundary Scan: An End-of-Term Report-IEEE Std 1149.1 Survey Results. IEEE Des. Test Comput. 9(2): 82-85 (1992) - 1991
- [j4]Colin M. Maunder, Rodham E. Tulloss:
An introduction to the boundary scan standard: ANSI/IEEE Std 1149.1. J. Electron. Test. 2(1): 27-42 (1991) - [c2]Colin M. Maunder:
Languages to Support Boundary-Scan Test. ITC 1991: 1104
1980 – 1989
- 1989
- [j3]Colin Maunder:
Built-in test for VLSI - pseudorandom techniques: Bardell, P H, McArney, W H and Savir, J Wiley, New York, NY, USA (1987) £45.00 pp 354. Microprocess. Microsystems 13(1): 62 (1989) - 1987
- [j2]Colin Maunder:
Bargain for testability researchers: Tsui, F FLSI/VLSI testability design McGrawHill, New York, NY, USA (1987) £49.95 pp 702. Microprocess. Microsystems 11(9): 519 (1987) - 1986
- [j1]Colin Maunder:
Digital logic testing and simulation: Alexander Miczo Harper and Row, Plymouth, UK (1986) £24.95 pp 141. Microprocess. Microsystems 10(10): 564 (1986) - 1983
- [c1]Colin M. Maunder:
HITEST Test Generation System Interfaces. ITC 1983: 324-332
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