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Nathan Kupp
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2010 – 2019
- 2015
- [j4]Ke Huang, Nathan Kupp, Constantinos Xanthopoulos, John M. Carulli Jr., Yiorgos Makris
:
Low-Cost Analog/RF IC Testing Through Combined Intra- and Inter-Die Correlation Models. IEEE Des. Test 32(1): 53-60 (2015) - [c15]Yichuan Lu, Kiruba S. Subramani, He Huang, Nathan Kupp, Yiorgos Makris
Silicon Demonstration of Statistical Post-Production Tuning. ISVLSI 2015: 628-633 - [c14]Yichuan Lu, Kiruba S. Subramani, He Huang, Nathan Kupp, Ke Huang, Yiorgos Makris
A comparative study of one-shot statistical calibration methods for analog / RF ICs. ITC 2015: 1-10 - 2013
- [c13]Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris
Handling discontinuous effects in modeling spatial correlation of wafer-level analog/RF tests. DATE 2013: 553-558 - [c12]Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris
On combining alternate test with spatial correlation modeling in analog/RF ICs. ETS 2013: 1-6 - [c11]Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris
Process monitoring through wafer-level spatial variation decomposition. ITC 2013: 1-10 - 2012
- [j3]Nathan Kupp, Yiorgos Makris
Applying the Model-View-Controller Paradigm to Adaptive Test. IEEE Des. Test Comput. 29(1): 28-35 (2012) - [c10]Nathan Kupp, Ke Huang, John M. Carulli Jr., Yiorgos Makris
Spatial correlation modeling for probe test cost reduction in RF devices. ICCAD 2012: 23-29 - [c9]Nathan Kupp, Ke Huang, John M. Carulli Jr., Yiorgos Makris
Spatial estimation of wafer measurement parameters using Gaussian process models. ITC 2012: 1-8 - [c8]Nathan Kupp, Yiorgos Makris
Integrated optimization of semiconductor manufacturing: A machine learning approach. ITC 2012: 1-10 - [c7]Dzmitry Maliuk, Nathan Kupp, Yiorgos Makris
Towards a fully stand-alone analog/RF BIST: A cost-effective implementation of a neural classifier. VTS 2012: 62-67 - 2011
- [j2]Nathan Kupp, He Huang, Yiorgos Makris
Improving Analog and RF Device Yield through Performance Calibration. IEEE Des. Test Comput. 28(3): 64-75 (2011) - [c6]Nathan Kupp, Mustapha Slamani, Yiorgos Makris:
Correlating inline data with final test outcomes in analog/RF devices. DATE 2011: 812-817 - [c5]Nathan Kupp, Haralampos-G. D. Stratigopoulos, Petros Drineas
On proving the efficiency of alternative RF tests. ICCAD 2011: 762-767 - 2010
- [c4]Yier Jin
DFTT: Design for Trojan Test. ICECS 2010: 1168-1171 - [c3]Nathan Kupp, He Huang, Petros Drineas
Post-production performance calibration in analog/RF devices. ITC 2010: 245-254
2000 – 2009
- 2009
- [j1]Nathan Kupp, Petros Drineas
On Boosting the Accuracy of Non-RF to RF Correlation-Based Specification Test Compaction. J. Electron. Test. 25(6): 309-321 (2009) - [c2]Yier Jin
Experiences in Hardware Trojan Design and Implementation. HOST 2009: 50-57 - 2008
- [c1]Nathan Kupp, Petros Drineas
Confidence Estimation in Non-RF to RF Correlation-Based Specification Test Compaction. ETS 2008: 35-40
Coauthor Index
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