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Pramodchandran N. Variyam
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Journal Articles
- 2010
- [j4]Ganesh Srinivasan, Abhijit Chatterjee, Sasikumar Cherubal, Pramodchandran N. Variyam:
Production Realization of MTPR Test on Low-Cost ATE for OFDM Based Communication Devices. J. Electron. Test. 26(4): 405-417 (2010) - 2002
- [j3]Pramodchandran N. Variyam, Sasikumar Cherubal, Abhijit Chatterjee:
Prediction of analog performance parameters using fast transienttesting. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(3): 349-361 (2002) - 2000
- [j2]Pramodchandran N. Variyam, Abhijit Chatterjee:
Digital-Compatible BIST for Analog Circuits Using Transient Response Sampling. IEEE Des. Test Comput. 17(3): 106-115 (2000) - [j1]Pramodchandran N. Variyam, Abhijit Chatterjee:
Specification-driven test generation for analog circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 19(10): 1189-1201 (2000)
Conference and Workshop Papers
- 2006
- [c14]Venkat Kalyanaraman, Bruce C. Kim, Pramodchandran N. Variyam, Sasikumar Cherubal:
DIBPro: Automatic Diagnostic Program Generation Tool. ITC 2006: 1-8 - 2005
- [c13]Ganesh Srinivasan, Sasikumar Cherubal, Pramodchandran N. Variyam, Melese Teklu, C. P. Wang, David Guidry, Abhijit Chatterjee:
Accurate measurement of multi-tone power ratio (MTPR) of ADSL devices using low cost testers. ETS 2005: 68-73 - 2003
- [c12]Kranthi K. Pinjala, Bruce C. Kim, Pramodchandran N. Variyam:
Automatic Diagnostic Program Generation for Mixed Signal Load Board. ITC 2003: 403-409 - 2002
- [c11]Achintya Halder, Abhijit Chatterjee, Pramodchandran N. Variyam, John Ridley:
Measuring Stray Capacitance on Tester Hardware. VTS 2002: 351-356 - 2000
- [c10]Pramodchandran N. Variyam:
Increasing the IDDQ test resolution using current prediction. ITC 2000: 217-224 - [c9]Pramodchandran N. Variyam, Vinay Agrawal:
Measuring code edges of ADCs using interpolation and its application to offset and gain error testing. ITC 2000: 349-357 - 1999
- [c8]Pramodchandran N. Variyam, Junwei Hou, Abhijit Chatterjee:
Test Generation for Analog Circuits Using Partial Numerical Simulation. VLSI Design 1999: 597-602 - [c7]Pramodchandran N. Variyam, Junwei Hou, Abhijit Chatterjee:
Efficient Test Generation for Transient Testing of Analog Circuits Using Partial Numerical Simulation. VTS 1999: 214-219 - 1998
- [c6]Pramodchandran N. Variyam, Abhijit Chatterjee:
Specification-Driven Test Design for Analog Circuits. DFT 1998: 335-340 - [c5]Pramodchandran N. Variyam, Abhijit Chatterjee:
Enhancing Test Effectiveness for Analog Circuits Using Synthesized Measurements. VTS 1998: 132-137 - [c4]Heebyung Yoon, Pramodchandran N. Variyam, Abhijit Chatterjee, Naveena Nagi:
Hierarchical Statistical Inference Model for Specification Based Testing of Analog Circuits. VTS 1998: 145-151 - 1997
- [c3]Pramodchandran N. Variyam, Abhijit Chatterjee:
Test generation for comprehensive testing of linear analog circuits using transient response sampling. ICCAD 1997: 382-385 - [c2]Pramodchandran N. Variyam, Abhijit Chatterjee:
FLYER: Fast Fault Simulation of Linear Analog Circuits Using Polynomial Waveform and Perturbed State Representation. VLSI Design 1997: 408-412 - [c1]Pramodchandran N. Variyam, Abhijit Chatterjee, Naveena Nagi:
Low-cost and efficient digital-compatible BIST for analog circuits using pulse response sampling. VTS 1997: 261-266
Informal and Other Publications
- 2004
- [i1]John M. Hitchcock, Aduri Pavan, Pramodchandran N. Variyam:
Partial Bi-Immunity and NP-Completeness. Electron. Colloquium Comput. Complex. TR04 (2004)
Coauthor Index
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