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Jae Wook Lee
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2020 – today
- 2024
- [c9]Ji-Hwan Hwang, Jung-Hwan Song, Kwang Ho Choi, Hansol Choi, Bo Ra Kim, Chul H. Jung, Seong Joo Maeng, Jae Wook Lee:
Bistatic SAR Raw Data Acquisition and Imaging with GPS Time-Synchronized Dual ECHO-SAR Systems. IGARSS 2024: 11401-11404 - 2023
- [j3]Prasannavenkatesh Durai
, Sue Jung Lee, Jae Wook Lee, Cheol-Ho Pan, Keunwan Park:
Iterative machine learning-based chemical similarity search to identify novel chemical inhibitors. J. Cheminformatics 15(1): 86 (2023)
2010 – 2019
- 2015
- [j2]Seongbo Shim, Jae Wook Lee, Youngsoo Shin:
An Analytical Approach to Thermal Design and Optimization With a Temperature-Dependent Power Model. IEEE Trans. Circuits Syst. I Regul. Pap. 62-I(3): 816-824 (2015) - 2012
- [c8]Jae Wook Lee, Ji Hwan (Paul) Chun, Jacob A. Abraham:
Indirect method for random jitter measurement on SoCs using critical path characterization. ETS 2012: 1-6 - [c7]Ji Hwan (Paul) Chun, Siew Mooi Lim, Shao Chee Ong, Jae Wook Lee, Jacob A. Abraham:
Test of phase interpolators in high speed I/Os using a sliding window search. VTS 2012: 134-139 - 2011
- [j1]Kihyuk Han, Joonsung Park, Jae Wook Lee, Jaeyong Chung
Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip. J. Electron. Test. 27(4): 429-439 (2011) - 2010
- [c6]Ji Hwan (Paul) Chun, Jae Wook Lee, Jacob A. Abraham:
A novel characterization technique for high speed I/O mixed signal circuit components using random jitter injection. ASP-DAC 2010: 312-317 - [c5]Joonsung Park, Jae Wook Lee, Jaeyong Chung
At-speed Test of High-Speed DUT Using Built-Off Test Interface. Asian Test Symposium 2010: 269-274 - [c4]Jae Wook Lee, Ji Hwan (Paul) Chun, Jacob A. Abraham:
A delay measurement method using a shrinking clock signal. ACM Great Lakes Symposium on VLSI 2010: 139-142
2000 – 2009
- 2009
- [b1]Jae Wook Lee:
GSF for guaranteed QoS in shared memory systems. Massachusetts Institute of Technology, Cambridge, MA, USA, 2009 - [c3]Jae Wook Lee, Ji Hwan (Paul) Chun, Jacob A. Abraham:
A Random Jitter RMS Estimation Technique for BIST Applications. Asian Test Symposium 2009: 9-14 - [c2]Kihyuk Han, Joonsung Park, Jae Wook Lee, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo, Sejang Oh:
Low-Complexity Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip. ETS 2009: 129-134 - 2004
- [c1]Seung Mo Cho, Jae Wook Lee:
Lightweight Specification-based Testing of Memory Cards: A Case Study. MBT 2004: 73-91
Coauthor Index
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last updated on 2024-09-28 01:28 CEST by the dblp team
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