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Israel Tirkel

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2010 – 2019

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2019
[j3]
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  - journals/candie/SagronKRT19
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Ruth Sagron, Yoav Kerner, Gad Rabinowitz, Israel Tirkel:
New LST of inter-departure times in PH/G/1 queue, and extensions to ME/G/1 and G/G/1 queues. Comput. Ind. Eng. 135: 518-527 (2019)
2017
[j2]
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Ruth Sagron, Gad Rabinowitz, Israel Tirkel:
Approximating class-departure variability in tandem queues with downtime events: Regression-based variability function. Comput. Oper. Res. 88: 161-174 (2017)
2016
[j1]
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Israel Tirkel:
The efficiency of inspection based on out of control detection in wafer fabrication. Comput. Ind. Eng. 99: 458-464 (2016)
[c6]
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  - conf/wsc/KalirT16
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Adar A. Kalir, Israel Tirkel:
Scheduling preventive maintenance within a queue time for maximum throughput in semiconductor manufacturing. WSC 2016: 2750-2761
2015
[c5]
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Maayan Eyal, Israel Tirkel:
Throughput and flow-time in a production line with partial machine availability and imperfect quality processing. WSC 2015: 3144-3145
2013
[c4]
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  - conf/case/GrosbardKTR13
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Dean Grosbard, Adar Kalir, Israel Tirkel, Gad Rabinowitz:
A queuing network model for wafer fabrication using decomposition without aggregation. CASE 2013: 717-722
[c3]
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Israel Tirkel:
The effectiveness of variability reduction in decreasing wafer fabrication cycle time. WSC 2013: 3796-3805
2012
[c2]
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  - conf/wsc/Tirkel12
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Israel Tirkel:
Optimized inspection capacity for out of control detection in semiconductor manufacturing. WSC 2012: 190:1-190:8
2010
[c1]
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  - conf/or/TirkelR10
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Israel Tirkel, Gad Rabinowitz:
Quality Performance Modeling in a Deteriorating Production System with Partially Available Inspection. OR 2010: 397-402

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