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Daniel Micusik
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2010 – 2019
- 2016
- [c7]Ahmed Awny, Rajasekhar Nagulapalli
, Daniel Micusik, Jan Hoffmann, Gunter Fischer, Dietmar Kissinger, Ahmet Cagri Ulusoy:
23.5 A dual 64Gbaud 10kΩ 5% THD linear differential transimpedance amplifier with automatic gain control in 0.13µm BiCMOS technology for optical fiber coherent receivers. ISSCC 2016: 406-407 - 2015
- [c6]Georg Winzer, Marcel Kroh, Stefan Lischke, Dieter Knoll, Karsten Voigt, Hui Tian, Christian Mai, Despoina Petousi, Daniel Micusik, Lars Zimmermann, Bernd Tillack, Klaus Petermann:
Monolithic photonic-electronic QPSK receiver for 28Gbaud. OFC 2015: 1-3 - 2014
- [j3]Mahdi M. Khafaji, Corrado Carta
A 32 GSps multiplexer with 1 kbit memory for arbitrary signal generation for testing digital-to-analogue converters. IET Circuits Devices Syst. 8(6): 459-468 (2014) - [c5]Dieter Knoll, Stefan Lischke, Lars Zimmermann, Bernd Heinemann, Daniel Micusík, P. Ostrovskyy, Georg Winzer, Marcel Kroh, Rainer Barth, Thomas Grabolla, K. Schulz, Mirko Fraschke, Marco Lisker, Jürgen Drews, Andreas Trusch, A. Kruger, Steffen Marschmeyer, Harald H. Richter, O. Fursenko, Yuji Yamamoto
Monolithically integrated 25Gbit/sec receiver for 1.55µm in photonic BiCMOS technology. OFC 2014: 1-3 - 2012
- [c4]Behnam Sedighi, Anh T. Huynh, Efstratios Skafidas
Design of hybrid resistive-capacitive DAC for SAR A/D converters. ICECS 2012: 508-511
2000 – 2009
- 2008
- [c3]Daniel Micusik, Horst Zimmermann
130dB-DR Transimpedance Amplifier with Monotonic Logarithmic Compression and High-Current Monitor. ISSCC 2008: 78-79 - 2007
- [c2]Daniel Micusik, Horst Zimmermann
A 240MHz-BW 112dB-DR TIA. ISSCC 2007: 554-621 - 2004
- [j2]Viera Stopjaková
Classification of Defective Analog Integrated Circuits Using Artificial Neural Networks. J. Electron. Test. 20(1): 25-37 (2004) - 2002
- [j1]Daniel Micusík, Viera Stopjaková
Application of Feed-forward Artificial Neural Networks to the Identification of Defective Analog Integrated Circuits. Neural Comput. Appl. 11(1): 71-79 (2002) - [c1]Viera Stopjaková
Neural Networks-Based Parametric Testing of Analog IC. DFT 2002: 408-418
Coauthor Index
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