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Hans-Werner Wiesbrock
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2020 – today
- 2024
- [c12]Hans-Werner Wiesbrock, Jürgen Großmann:
Outline of an Independent Systematic Blackbox Test for ML-based Systems. AITest 2024: 1-10 - [c11]Nicolas Grube, Mozhdeh Massah, Michael Tebbe, Paul Wancura, Hans-Werner Wiesbrock, Jürgen Großmann, Sami Kharma
:
On a Systematic Test of ML-Based Systems: Experiments on Test Statistics. AITest 2024: 11-20 - [c10]Jens Bielefeldt, Kai-Uwe Basener, Roman Krajewski, Hans-Werner Wiesbrock, Marc Reichenbach, Michael Hübner:
DeepTest: Using Machine Learning for Generating new Testsequences. MECO 2024: 1-9 - [i1]Hans-Werner Wiesbrock, Jürgen Großmann:
Outline of an Independent Systematic Blackbox Test for ML-based Systems. CoRR abs/2401.17062 (2024) - 2022
- [c9]Jürgen Großmann
Test and Training Data Generation for Object Recognition in the Railway Domain. SEFM Workshops 2022: 5-16 - 2021
- [c8]Stefan Scharoba
Towards Machine Learning Support for Embedded System Tests. DSD 2021: 166-173 - [c7]Jens Bielefeldt, Kai-Uwe Basener, Siddique Reza Khan, Mozhdeh Massah, Hans-Werner Wiesbrock, Stefan Scharoba, Michael Hübner:
Einsatz von Deep Learning für den Test Eingebetteter Systeme. GI-Jahrestagung 2021: 1859-1864 - [c6]Jens Bielefeldt, Kai-Uwe Basener, Siddique Reza Khan, Mozhdeh Massah, Hans-Werner Wiesbrock, Stefan Scharoba
DeepTest: How Machine Learning Can Improve the Test of Embedded Systems. MECO 2021: 1-6
2010 – 2019
- 2015
- [j2]Hans-Werner Wiesbrock, Robert Schmidt:
Standardisierte Prüfungen von Anforderungen bei der Entwicklung von automobilen Steuergeräten. Softwaretechnik-Trends 35(1) (2015) - [c5]Hans-Werner Wiesbrock:
Eine Stochastische Testmethodik für den Robustheitstest Automobiler Steuergeräte. GI-Jahrestagung 2015: 1621-1633 - 2012
- [p2]Hendrik Heinze, Khalid Kallow, Hartmut Lackner, Sadegh Sadeghipour, Holger Schlingloff
Application and Evaluation in the Healthcare Domain. Model-Based Engineering of Embedded Systems 2012: 215-230 - 2011
- [p1]Jürgen Großmann, Philip Makedonski, Hans-Werner Wiesbrock, Jaroslav Svacina, Ina Schieferdecker, Jens Grabowski:
Model-Based X-in-the-Loop Testing. Model-Based Testing for Embedded Systems 2011 - 2010
- [j1]Jürgen Großmann, Hans-Werner Wiesbrock:
Wiederverwendbarkeit und Management von modellbasierten X-in-the-Loop Tests mit TTCN-3 Embedded. Softwaretechnik-Trends 30(2) (2010) - [c4]Hans-Werner Wiesbrock:
Ansätze zum Nachweis der Gleichwertigkeit von Software-Komponenten. Software Engineering (Workshops) 2010: 115-126
2000 – 2009
- 2008
- [c3]Jürgen Großmann, Ina Schieferdecker, Hans-Werner Wiesbrock:
Modeling Property Based Stream Templates with TTCN-3. TestCom/FATES 2008: 70-85 - 2007
- [c2]Carsten Gips, Hans-Werner Wiesbrock:
Notation und Verfahren zur automatischen Überprüfung von temporalen Signalabhängigkeiten und -merkmalen für modellbasiert entwickelte Software. MBEES 2007: 51-60 - 2002
- [c1]Hans-Werner Wiesbrock, Heiko Dörr, Hans Jürgen Holberg:
Model Checking im Automotivbereich. GI Jahrestagung 2002: 819-823
Coauthor Index
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