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Andreas Kux

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2020 – today

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2023
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Alessandro Grossi, Matteo Coppetta, Stefano Aresu, Andreas Kux, Thomas Kern, Robert Strenz:
28nm Data Memory with Embedded RRAM Technology in Automotive Microcontrollers. IMW 2023: 1-4

2010 – 2019

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2014
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Andreas Kux, Rudolf Ullmann, Thomas Kern, Roland Strunz, Hanno Melzner, Stephan Beuven, Andreas Haase:
Latent defect detection in microcontroller embedded flash test using device stress and wordline outlier screening. ITC 2014: 1-7

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