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Kevin Sanchez
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2020 – today
- 2022
- [j20]Kevin Sanchez, Bilel Achour
, Antony Coustou, Aurélie Lecestre, Samuel Charlot, Maylis Lavayssière
Transient Response of Miniature Piezoresistive Pressure Sensor Dedicated to Blast Wave Monitoring. Sensors 22(24): 9571 (2022)
2010 – 2019
- 2018
- [j19]Anthony Boscaro
Automatic localization of signal sources in photon emission images for integrated circuit analysis. Signal Image Video Process. 12(4): 775-782 (2018) - 2017
- [j18]Anthony Boscaro
Pattern image enhancement by automatic focus correction. Microelectron. Reliab. 76-77: 249-254 (2017) - [c2]Anthony Boscaro, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak:
Automatic defect localization in VLSI circuits: A fusion approach based on the Dempster-Shafer theory. FUSION 2017: 1-8 - 2016
- [j17]Roberta Pilia, Guillaume Bascoul
Single Event Transient acquisition and mapping for space device Characterization. Microelectron. Reliab. 64: 73-78 (2016) - [j16]Chung Tah Chua, Hock Guan Ong, Kevin Sanchez, Philippe Perdu, Chee Lip Gan
Effects of voltage stress on the single event upset (SEU) response of 65 nm flip flop. Microelectron. Reliab. 64: 199-203 (2016) - [j15]Anthony Boscaro
Automatic process for time-frequency scan of VLSI. Microelectron. Reliab. 64: 299-305 (2016) - 2015
- [j14]Samuel Chef
Unsupervised image processing scheme for transistor photon emission analysis in order to identify defect location. J. Electronic Imaging 24(1): 013019 (2015) - [j13]Samuel Chef
Unsupervised learning for signal mapping in dynamic photon emission. Microelectron. Reliab. 55(9-10): 1564-1568 (2015) - [j12]Anthony Boscaro
Improvement of signal to noise ratio in electro optical probing technique by wavelets filtering. Microelectron. Reliab. 55(9-10): 1585-1591 (2015) - [j11]Kevin Melendez, A. Desmoulin, Kevin Sanchez, Philippe Perdu, Dean Lewis:
A way to implement the electro-optical technique to inertial MEMS. Microelectron. Reliab. 55(9-10): 1916-1919 (2015) - 2014
- [j10]Mohamed Mehdi Rebaï, Frédéric Darracq, Jean-Paul Guillet
A comprehensive study of the application of the EOP techniques on bipolar devices. Microelectron. Reliab. 54(9-10): 2088-2092 (2014) - [j9]Samuel Chef
Pattern image enhancement by extended depth of field. Microelectron. Reliab. 54(9-10): 2099-2104 (2014) - 2013
- [j8]Samuel Chef
Frequency mapping in dynamic light emission with wavelet transform. Microelectron. Reliab. 53(9-11): 1387-1392 (2013) - 2010
- [j7]David Veyrié, Olivier Gilard, Kevin Sanchez, Sébastien Lhuillier, Frédéric Bourcier:
New methodology for the assessment of the thermal resistance of laser diodes and light emitting diodes. Microelectron. Reliab. 50(4): 456-461 (2010) - [j6]A. Deyine, Kevin Sanchez, Philippe Perdu, F. Battistella, Dean Lewis:
CADless laser assisted methodologies for failure analysis and device reliability. Microelectron. Reliab. 50(9-11): 1236-1240 (2010)
2000 – 2009
- 2008
- [j5]Magdalena Sienkiewicz, Philippe Perdu, Abdellatif Firiti, Kevin Sanchez, Olivier Crépel, Dean Lewis:
Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICs. Microelectron. Reliab. 48(8-9): 1529-1532 (2008) - 2007
- [j4]Felix Beaudoin, Kevin Sanchez, Philippe Perdu:
Dynamic laser stimulation techniques for advanced failure analysis and design debug applications. Microelectron. Reliab. 47(9-11): 1517-1522 (2007) - [c1]Julie Ferrigno, Philippe Perdu, Kevin Sanchez, Dean Lewis:
Identification of process/design issues during 0.18 µm technology qualification for space application. DATE 2007: 989-993 - 2005
- [j3]Kevin Sanchez, Romain Desplats, Felix Beaudoin, Philippe Perdu, J. P. Roux, G. Woods, Dean Lewis:
NIR laser stimulation for dynamic timing analysis. Microelectron. Reliab. 45(9-11): 1459-1464 (2005) - [j2]Felix Beaudoin, Kevin Sanchez, Romain Desplats, Philippe Perdu, Jean Marc Nicot, J. P. Roux, M. Otte:
Dynamic Laser Stimulation Case Studies. Microelectron. Reliab. 45(9-11): 1538-1543 (2005) - 2003
- [j1]Kevin Sanchez, Romain Desplats, Guy Perez, V. Pichetto, Felix Beaudoin, Philippe Perdu:
Solar Cell Analysis with Light Emission and OBIC Techniques. Microelectron. Reliab. 43(9-11): 1755-1760 (2003)
Coauthor Index
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